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UID:20260306T234748-WA94X1@ecpe.org
DTSTAMP:20260306T234748
DTSTART:20260324T120000
DTEND:20260325T123000
SUMMARY:Testing and Electrical Characterisation of Power Semiconductor Devices - Basics | ECPE/Cluster Tutorial
LOCATION:Nuremberg Deutschland
END:VEVENT
END:VCALENDAR