BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//ECPE e.V.//NONSGML v1.0//EN
BEGIN:VEVENT
UID:20260910T034257-WA94X1@ecpe.org
DTSTAMP:20260910T034257
DTSTART:20270223T120000
DTEND:20270224T133000
SUMMARY:Testing and Electrical Characterisation of Power Semiconductor Devices - Basics | ECPE/Cluster Tutorial
LOCATION:Nuremberg Deutschland
END:VEVENT
END:VCALENDAR