Registration Deadline: 10 March 2021

In order to reduce design iterations and time-to-production, components for embedded systems, such as the power electronics which drive an electric motor in an electric vehicle for example, have to be tested in as realistic conditions as possible before being qualified in a real environment. Hardware-in-the-loop (HIL) testing provides thorough and repeatable testing conditions by simulating not just the environment of operation but also system-wide inputs and disturbances. By this, not only the functionality of the device under test may be validated, but also the behaviour to simulated misfunctions of connected components. At the same time sensors in the system can measure changes in the tested component for reliability and end-of-life predictions.
This workshop aims to address the different HIL-techniques relevant to power electronics. In addition to presenting state-of-the-art examples of HIL, future trends like the impact of the introduction of very high frequency Wide Bandgap Devices on real-time simulation in the loop will be discussed.
In bringing experts in various HIL technologies within the ECPE network together with academics and end-users who would like to get insight into the latest developments in this field, it is expected that both newcomers to HIL technologies as well as experienced practitioners who want to get an overview of this challenging field will benefit from the presentations and discussions covered in this workshop.

All presentations and discussions will be in English.