Schulung

ECPE/Cluster-Tutorial: Testing and Electrical Characterization of Power Semiconductor Devices

Datum: 08/12/2021 - 09/12/2021

Ort: Reutlingen, Deutschland

Fachliche Leitung:

Prof. Dr.-Ing. Ingmar Kallfass, University of Stuttgart


Organisation:
Krista Schmidt
+49 911 81 02 88 - 16
krista.schmidt(at)ecpe.org  

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ECPE/Cluster-Tutorial: Testing and Electrical Characterization of Power Semiconductor Devices

Registration Deadline: 1 December 2021


The dynamic properties of fast-switching power semiconductor devices can only be measured properly if the power semiconductors are integrated in real circuits and applications.
This tutorial requires basic knowledge in power semiconductor characterization e.g. with static measurements. Important and relevant measuring techniques including dynamic measurements will be presented that can be used to test and characterize power semiconductor devices in applications.
The lectures can optionally be supplemented by attending a following practical course in the Bosch Innolab. There the participants can perform own measurements in small groups under supervision.



Objectives:

  • Knowledge of relevant physical quantities for testing or characterization of fast-switching power semiconductor devices
  • Competence to interpret the corresponding information in standards and data sheets
  • Knowledge of possible measuring techniques to be able to check and characterize fast-switching devices in applications
  • Knowledge of the advantages and disadvantages or limits of the various measuring techniques
  • Competence for the conception and execution of measurements

Target Audience of this Tutorial:

  • Developers of power electronic boards and systems who use, specify and select the fast-switching power semiconductor devices
  • Engineers from quality assurance and quality management
  • Manufacturer of power semiconductor devices
  • Engineers from universities and research institutes

All presentations and discussions will be in English language.

Schulung

ECPE/Cluster-Tutorial: Testing and Electrical Characterization of Power Semiconductor Devices

Datum: 08/12/2021 - 09/12/2021

Ort: Reutlingen, Deutschland

Fachliche Leitung:

Prof. Dr.-Ing. Ingmar Kallfass, University of Stuttgart


Organisation:
Krista Schmidt
+49 911 81 02 88 - 16
krista.schmidt(at)ecpe.org  

Online-Registration

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Industry: ECPE Member Companies: 25 % discount for each participant

University/institutes: 10 % discount for ECPE Competence Centres

Students/PhD students: Please send a copy of your student ID/students seats are limited

www.ecpe.org/members 

Register before 1 December 2021

  • The fee includes dinner, lunch, hot and cold drinks and potential updates by download link (afterwards). The reduced (PhD) students fee includes all the above except for dinner (can be booked for an extra fee of € 50*)
  • The presentations will be provided by email via a download link short before the event. A printed version of the tutorial handout is available on request (€ 50,-*).
  • With the confirmation of registration by email you are registered for the tutorial and the invoice will be sent by email.
  • Payment by credit card not possible.
  • Cancellation policy: Full amount will be refunded in case of cancellation up to 2 weeks prior to the event. After this date and in case of no-show
    50 % of the fee is non-refundable (substitutes are accepted anytime).
  • Photo material will be created at the event. Potentially a picture of the participants can be taken and used for editorial reporting.
  • By participating in one of our events, you confirm that you are aware of and comply with our hygiene concept.
  • Due to the General Data Protection Regulation, we kindly point out that we have to store your personal data in our CRM system in order to process your registration. The ECPE Privacy Policy can be found at www.ecpe.org/privacy-policy
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