Schulung

Testing and Electrical Characterisation of Power Semiconductor Devices - Basics | ECPE/Cluster Tutorial

Datum: 18/02/2025 - 19/02/2025

Ort: Nuremberg, Deutschland

Fachliche Leitung:

Prof. Dr.-Ing. Ingmar Kallfass, University of Stuttgart


Organisation:
Krista Schmidt
+49 911 81 02 88 - 16
krista.schmidt(at)ecpe.org


Registration Deadline: 11 February 2025

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Testing and Electrical Characterisation of Power Semiconductor Devices - Basics | ECPE/Cluster Tutorial

This tutorial aims to provide an introduction to the basic measurement techniques used to test and characterize power semiconductor devices. Participants will gain a fundamental understanding of which measurements are needed to characterize a power electronic semiconductor and the measurement principles that are used as the basis. We will also discuss the relevance and informational value of data sheet parameters and provide insight into how to use this information.

During the presentations, experiments will be demonstrated to provide practical examples.

Aims

  • Basic knowledge of switching and commutation of power semiconductor devices in real circuit environment
  • Knowledge of relevant physical dimensions for testing/characterising power semiconductor devices
  • Competence to interpret relevant data sheet information
  • Knowledge of physical and technological basics of different measuring techniques
  • Knowledge of advantages and disadvantages of different measuring techniques

Target group
This tutorial is mainly meant for

  • Developers of power electronic systems
  • Employees working in quality management
  • Semiconductor manufacturers
  • Universities and research facilities

All presentations and discussions will be in English language.

Schulung

Testing and Electrical Characterisation of Power Semiconductor Devices - Basics | ECPE/Cluster Tutorial

Datum: 18/02/2025 - 19/02/2025

Ort: Nuremberg, Deutschland

Fachliche Leitung:

Prof. Dr.-Ing. Ingmar Kallfass, University of Stuttgart


Organisation:
Krista Schmidt
+49 911 81 02 88 - 16
krista.schmidt(at)ecpe.org


Registration Deadline: 11 February 2025

Testing and Electrical Characterization of Power Semiconductor Devices - Advanced Course (2025)

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Participation

Industry: ECPE Member Companies: 25 % discount for each participant

University/institutes: 10 % discount for ECPE Competence Centres

Students/PhD students: Please send a copy of your student ID/students seats are limited

www.ecpe.org/members 

Register before 11 February 2025

  • The regular participation fee includes dinner, lunches, coffee/soft drinks. The reduced (PhD) students fee includes all the above except for dinner (can be booked for an extra fee of € 50*)
  • The presentations will be provided by email via a download link short before the event. A printed version of the tutorial handout is available on request (€ 50,-*).
  • With the confirmation of registration by email you are registered for the tutorial and the invoice will be sent by email.
  • Payment by credit card not possible.
  • Cancellation policy: Full amount will be refunded in case of cancellation up to 2 weeks prior to the event. After this date 50 % of the fee is non-refundable (substitutes are accepted anytime).
  • Photo material will be created at the event. Potentially a picture of the participants can be taken and used for editorial reporting.
  • By participating in one of our events, you confirm that you are aware of and comply with the hygiene concept.
  • If the event cannot take place because of force majeure or for good cause, a change to an online format or a cancellation is possible. The delegates shall be informed immediately. In this case, the participant is able to cancel free of charge. No claims beyond this shall be entertained.
  • The number of participants is limited to 35 attendees.
  • Due to the General Data Protection Regulation, we kindly point out that we have to store your personal data in our CRM system in order to process your registration. The ECPE Privacy Policy can be found at www.ecpe.org/privacy-policy
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