Schulung
Datum: 09/04/2025 - 10/04/2025
Ort: Reutlingen, Deutschland
Fachliche Leitung:
Prof. Dr.-Ing. Ingmar Kallfass, University of Stuttgart
Organisation:
Krista Schmidt
+49 911 81 02 88 - 16
krista.schmidt(at)ecpe.org
Registration Deadline: 2 April 2025
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The dynamic properties of fast-switching power semiconductor devices can only be measured properly if the power semiconductors are integrated in real circuits and applications.
This tutorial requires basic knowledge in power semiconductor characterization e.g. with static measurements. Important and relevant measuring techniques including dynamic measurements will be presented that can be used to test and characterize power semiconductor devices in applications.
The lectures can optionally be supplemented by attending a following practical course in the Bosch Innolab. There the participants can perform own measurements in small groups under supervision.
Objectives:
Target Audience of this Tutorial:
Schulung
Datum: 09/04/2025 - 10/04/2025
Ort: Reutlingen, Deutschland
Fachliche Leitung:
Prof. Dr.-Ing. Ingmar Kallfass, University of Stuttgart
Organisation:
Krista Schmidt
+49 911 81 02 88 - 16
krista.schmidt(at)ecpe.org
Registration Deadline: 2 April 2025
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